April 2, 2020
Covid-19

A Covid-19 Update From AAT

While COVID-19 has affected all industries, including manufacturing and metrology, we want to extend positive thoughts for you and your family during this unprecedented time. The […]
March 4, 2020
AAT News Article on Manufacturing News website

Automating Metrology Data on Machining Centers Paper at Manufacturing News

Ray Karadayi, Preseident and CEO of Applied Automation Technologies has written a very informative article titled “Automating Metrology Data on Machining Centers”The article can be read […]
March 4, 2020
Applied-Automation-DMG-MORI-Partner

AAT and DMG MORI USA Announce Partnership for On-Machine Measuring Software

March 1,2020 AAT and DMG Mori USA announce partnership for on-machine measuring software. Applied Automation Technologies (AAT) and DMG Mori USA will offer this innovative technology […]
February 24, 2020
AAT Logo

AAT at Two Shows in Turkey

Applied Automation Turkey will be exhibiting at two shows in Turkey this year. We will be at the Control, Automotive, Aerospace Technologies Testing Equipment, Metrology and […]
February 24, 2020
Taipei Intelligent Machinery & Manufacturing Technology Show

CappsNC at the Taipei Intelligent Machinery & Manufacturing Show

AAT’s Taiwan distributor USYNC is preparing to exhibit CappsNC at the Taipei Intelligent Machinery & Manufacturing Technology Show (iMTduo). The show will take place 05/08/2020-05/12/2020 at […]
February 12, 2020

AAT Open House

Applied Automation Technologies is host an open house on November 11 of 2020 at our Rochester Hills, MI office.We look forward to seeing you there! Applied […]
February 1, 2020
IMTS 2020 Logo

Come See AAT at IMTS

Applied Automation Technologies will be at IMTS 2020! IMTS 2020 is Sept 14-20 at McCormick Place in Chicago. We can be found at booth 135663 in […]
August 12, 2016
MetrologyNews

AAT In The News

 Ray Karadayi, Preseident and CEO of Applied Automation Technologies has written a very informative article titled “The Road To Smart Machining – Automating Metrology Data on […]